Support

Support Options

Submit a Support Ticket

 

Interface Trap Density Metrology from Sub-Threshold Transport in Highly Scaled Undoped Si n-FinFETs Edit

By: Abhijeet Paul, Giuseppe Tettamanzi, Sunhee Lee, Saumitra Mehrotra, N. Collaert, S. Biesemans, Sven Rogge, G Klimeck
Abhijeet Paul, Giuseppe Tettamanzi, Sunhee Lee, Saumitra Mehrotra, N. Collaert, S. Biesemans, Sven Rogge, G Klimeck, (2011), "Interface Trap Density Metrology from Sub-Threshold Transport in Highly Scaled Undoped Si n-FinFETs", AIP, 12: pg: -, Cited by:

About

Type arXiv
Publisher AIP
Ref Type R
Date submitted February 16, 2011
Year 2011
Month 00
Issue/Number 12
Pages -
Text snippet/Notes {{none}}
Submitted By Swaroop S
Submitted Friday, May 20, 2011 @ 12:00am

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.