We describe the development of the modeling efforts focused towards proper description of the threshold voltage fluctuations due to the discrete impurity effects (different number and different distribution of the impurities from device to device on the same chip).NSF, ONRW. J. Gross, D. Vasileska and D. K. Ferry, “A Novel Approach for Introducing the Electron-Electron and Electron-Impurity Interactions in Particle-Based Simulations,” IEEE Electron Device Lett. 20, No. 9, pp.463-465 …

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