nanoHUB will be intermittently unavailable due to scheduled host maintenance on Sunday, January 21st, 2018 from 7:00 am ET through 5:00 pm ET. All tool sessions will be expired when maintenance begins. We apologize for any inconvenience. close
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.