Simulations Tools that connect to the Rice cluster will be inoperable due to system upgrades from Tuesday, May 29th, 2018, 8:00am ET to Wednesday May 30, 2018, 5:00pm ET. We apologize for any inconvenience. close
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.