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Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the oscillating tip, and the basic theory of some of the common modes of AFM operation. The tutorial summarizes some of the exciting new applications of Atomic Force Microscopy.