nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM

nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM

Offering: 01a Section: Self Paced

Video
  • Lecture L3.3: AFM Components 1. Lecture L3.3: AFM Components 0
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  • What’s special about an AFM? 2. What’s special about an AFM? 90.733333333333334
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  • The Atomic Force Microscope: Paper 001 3. The Atomic Force Microscope: P… 142.96666666666667
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  • Why the AFM Works 4. Why the AFM Works 178.93333333333334
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  • Commercially available microcantilever force transducers 5. Commercially available microca… 308.76666666666665
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  • Detecting Deflection 6. Detecting Deflection 365.26666666666665
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  • Notation: Cantilever Dimensions 7. Notation: Cantilever Dimension… 421.13333333333333
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  • Detecting Cantilever Deflection with a Segmented Photodiode 8. Detecting Cantilever Deflectio… 512.86666666666667
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  • Maintaining a constant force 9. Maintaining a constant force 806
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  • Principle of Feedback: controlled modification of a dynamical system 10. Principle of Feedback: control… 923.4666666666667
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  • Need to Minimize Thermal Drift 11. Need to Minimize Thermal Drift 1041.6666666666667
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  • Reducing Floor Vibrations 12. Reducing Floor Vibrations 1122.9333333333334
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  • Achieving Vibrationless Motion at the Nanoscale 13. Achieving Vibrationless Motion… 1236.2
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  • Piezoelectric Creep and Hysteresis 14. Piezoelectric Creep and Hyster… 1308.2333333333334
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  • Flexure Scanners/Nanopositioning Stages 15. Flexure Scanners/Nanopositioni… 1390.2
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  • Closed Loop Scanners – Linearized Scanning 16. Closed Loop Scanners – Linea… 1467.9
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  • Important Electrical Signals 17. Important Electrical Signals 1502.5666666666666
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  • Up Next: AFM Calibration 18. Up Next: AFM Calibration 1505.4666666666667
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L3.3: AFM - The Instrument - AFM Components

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