nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM

nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM

Offering: 01a Section: Self Paced

Video
  • Lecture 3.5: Contact Mode Scans 1. Lecture 3.5: Contact Mode Scan… 0
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  • The Purpose of a Microscope is to Obtain an Image 2. The Purpose of a Microscope is… 38.633333333333333
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  • Contact Mode AFM 3. Contact Mode AFM 140.8
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  • Overcoming Inherent Barriers 4. Overcoming Inherent Barriers 274.2
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  • Steps for Contact Mode Scanning - Overview 5. Steps for Contact Mode Scannin… 375.5
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  • Good sample preparation is crucial 6. Good sample preparation is cru… 417.46666666666664
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  • Positioning the Laser 7. Positioning the Laser 481.23333333333335
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  • The Coarse Approach 8. The Coarse Approach 572.33333333333337
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  • Optimizing the Feedback Loop 9. Optimizing the Feedback Loop 674.0333333333333
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  • The AFM Feedback Loop 10. The AFM Feedback Loop 701.2
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  • Typical Feedback Loop Response to a Step Change 11. Typical Feedback Loop Response… 927.16666666666663
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  • The classic Ziegler-Nichols Tuning Rule – one example 12. The classic Ziegler-Nichols Tu… 1085.0666666666666
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  • Trends 13. Trends 1177.3
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  • Why a tuning rule may not work 14. Why a tuning rule may not work 1262.5666666666666
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  • What actually occurs 15. What actually occurs 1318.6
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  • An Empirical Procedure for Setting KP and KI 16. An Empirical Procedure for Set… 1426.8333333333333
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  • Once you have the image – need versatile data processing software 17. Once you have the image – ne… 1454.0333333333333
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  • Many Applications 18. Many Applications 1533.9
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  • Up Next: The AFM as a System 19. Up Next: The AFM as a System 1585.7333333333334
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L3.5: AFM - The Instrument - Contact Mode Scans

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