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Week 1: Introduction to Reliability Physics
Week 1: Supplementary Information
- Reliability from material science point of view: Why things break by M. Eberhart. Harmony Books, 2003. ISBN 1-4000-4760-9
Week 4: Interface Reliability of Semiconductor Devices (Continued)
Week 5: Interface Reliability of Semiconductor Devices: Hot Carrier Degradation
Week 5: Supplementary Information
- Reference Paper 1: (H2-D2 Isotope Effect)
- Reference Paper 2: (Analytical Solution of Poisson Equation in 2D MOSFET)
- Reference Paper 3: (Analytical Solution to Drain Current in 2D MOSFET)