Events: Details

Introduction to XPS: What you should know about X-ray photoelectron spectroscopy?

Category: conference/workshop
Description: XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard techniques for the characterization of solid surface. The course will teach how and what information can be provided by XPS. Course Objectives • Learn physics principles of X-ray Photoelectron Spectroscopy (XPS). • Learn about the analysis of surfaces with XPS and limitations of the technique. • Learn approaches for qualitative and quantitative analysis of XPS data. • Learn the types of problems that can be solved with XPS: examples. • Advanced data analysis: coverage calculation, thin film thickness calculation, etc. The 3rd day (optional) will be dedicated to the data analysis using particular XPS software (CasaXPS, XPSfit and SciPlot (Mac)).
When: Wednesday 22 September, 2010 8:00 am EDT - Friday 24 September, 2010 5:00 pm EDT
Where: Burton D. Morgan Center, Room 129, Purdue Universty, West Lafayette, IN
Website: http://www.purdue.edu/discoverypark/nanotechnology/XPS/
Tags:
  1. materials science
  2. X-Ray Photoelectron Spectroscopy
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