||XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard techniques for the characterization of solid surface. The course will teach how and what information can be provided by XPS.
• Learn physics principles of X-ray Photoelectron Spectroscopy (XPS).
• Learn about the analysis of surfaces with XPS and limitations of the technique.
• Learn approaches for qualitative and quantitative analysis of XPS data.
• Learn the types of problems that can be solved with XPS: examples.
• Advanced data analysis: coverage calculation, thin film thickness calculation, etc.
The 3rd day (optional) will be dedicated to the data analysis using particular XPS software (CasaXPS, XPSfit and SciPlot (Mac)).
Wednesday 22 September, 2010 5:00 pm EDT - Saturday 25 September, 2010 2:00 am EDT
||Burton D. Morgan Center, Room 129, Purdue Universty, West Lafayette, IN
- materials science
- X-Ray Photoelectron Spectroscopy