Introduction to XPS: What you should know about X-ray photoelectron spectroscopy?
|Description:||XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard techniques for the characterization of solid surface. The course will teach how and what information can be provided by XPS. Course Objectives • Learn physics principles of X-ray Photoelectron Spectroscopy (XPS). • Learn about the analysis of surfaces with XPS and limitations of the technique. • Learn approaches for qualitative and quantitative analysis of XPS data. • Learn the types of problems that can be solved with XPS: examples. • Advanced data analysis: coverage calculation, thin film thickness calculation, etc. The 3rd day (optional) will be dedicated to the data analysis using particular XPS software (CasaXPS, XPSfit and SciPlot (Mac)).|
|When:||Wednesday 22 September, 2010 8:00 am EDT - Friday 24 September, 2010 5:00 pm EDT|
|Where:||Burton D. Morgan Center, Room 129, Purdue Universty, West Lafayette, IN|