|Description:||XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard techniques for the characterization of solid surface. The course will teach how and what information can be provided by XPS.
• Learn physics principles of X-ray Photoelectron Spectroscopy (XPS).
• Learn about the analysis of surfaces with XPS and limitations of the technique.
• Learn approaches for qualitative and quantitative analysis of XPS data.
• Learn the types of problems that can be solved with XPS: examples.
• Advanced data analysis: coverage calculation, thin film thickness calculation, etc.
The 3rd day (optional) will be dedicated to the data analysis using particular XPS software (CasaXPS, XPSfit and SciPlot (Mac)).
|When:||Wednesday 22 September, 2010 1:00 pm BST - Friday 24 September, 2010 10:00 pm BST|
|Where:||Burton D. Morgan Center, Room 129, Purdue Universty, West Lafayette, IN|