Events: Details

Illinois AMC 2012 6th Advanced Materials Characterization Workshop

Category: conference/workshop
Description: This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques: Atomic force microscopy (AFM) X-ray diffraction, reflectivity and fluorescence (XRD, XRR, XRF) including high-temperature analysis Scanning and transmission electron microscopy (SEM, TEM, STEM); focused ion beam (FIB) Auger electron spectroscopy (AES), and x-ray photoelectron spectroscopy (XPS) Secondary ion mass spectrometry (SIMS), and Rutherford backscattering (RBS) Optical spectroscopy (Raman, Photoluminescence, FTIR, ellipsometry, etc.) Optical microscopy (confocal microscopy, near-field scanning optical microscopy, Raman microscopy, etc.) Nanoindentation analysis (including nano electric contact resistance, acoustic emission, and nano dynamical mechanical analysis). Biological materials: tutorial on sample prep and analysis of biological material. Lectures will be presented by scientists with extensive academic and industrial experience in each technique. The following topics will be covered: A short review of the fundamentals of each analytical technique. Critical review of strengths and weaknesses of each technique: how to combine techniques to extract the best possible complementary information. Comparative review of the instrumentation options with emphasis on differences in resolution, sensitivity, detection limits, sample requirements. Data acquisition strategies and data processing methods. Expert tips on how to avoid measurement artifacts. Detailed discussion of practical examples including industrial applications in areas such as nanotechnology, microelectronics, thin films, coatings, bioengineering, mineralogy, medical, and pharmaceutical research. The workshop will also include an instrument vendors' show, where industrial scientists will introduce new instrumentation and discuss new applications and technologies. Laboratory tours displaying the main analytical instruments available at the MRL will be offered during this workshop. Register now, space is limited. (Registration is required.) Registration fee: $65 per person. This includes full access to lectures, vendors show, downloadable literature, lab tours, lunches, beverage/food during breaks, reception and networking events. Contacts amcw2012@mrl.illinois.edu Mauro Sardela, (217) 244-0547
When: Wednesday 06 June, 2012 7:00 am BST - Thursday 07 June, 2012 4:00 pm BST
Where: University of Illinois at Urbana-Champaign (Engineering Sciences Building, Room 190)
Website: http://mrl.illinois.edu/news/conferences-workshops/amc-2012
Tags:
  1. atomic force microscopy
  2. biological materials
  3. Nanoindentation
  4. RAMAN
  5. sem
  6. STEM
  7. TEM
  8. x-ray
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