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  • Created 07 Aug 2013

Description



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Related Courses

Reliability Physics of Nanoelectronic Transistors: Prof. Alam’s website
Reliability from System point of view: Fault-tolerant computing: Prof. Bagchi’s website
Reliability from Fracture Mechanics: Prof. Zavattieri’s website

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Review Paper



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Seminar

On the Reliability of Micro-Electronic Devices: An Introductory Lecture on Negative Bias Temperature Instability
Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices
Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors
OPV: Untangling the Essence of Bulk Heterostructure Organic Solar Cells: Why the Complex Need not be Complicated

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Tools

Modeling Interface-defect Generation (MIG)
PVpanel Sim
PV Analyzer

Additional Tools….


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