Atomic Force Microscopy
01 Dec 2005 | Online Presentations | Contributor(s): Arvind Raman
Atomic Force Microscopy (AFM) is an indispensible tool in nano science for the fabrication, metrology, manipulation, and property characterization of nanostructures. This tutorial reviews some of the physics of the interaction forces between the nanoscale tip and sample, the dynamics of the oscillating tip, and the basic theory of some of the common modes of AFM operation. The tutorial summarizes some of the exciting new applications of Atomic Force Microscopy.
BNC Annual Research Review: Recent advances in dynamic Atomic Force Microscopy Research at Birck
02 Dec 2009 | Online Presentations | Contributor(s): Arvind Raman
In conjunction with R. Reifenberger, B. Pipes, R. Moon
X. Xu, J. Melcher, R. Wagner, D. Kiracofe.
Fine Tuning Microcantilever Vibrations for Ultrasensitive Analyte Mass Detection
27 Jul 2005 | Online Presentations | Contributor(s): Arvind Raman
Microcantilever based biochemical sensing has shown tremendous promise for ultrasenstive detection in both liquid and ambient conditions. However improving the sensitivity, reliability and robustness of these sensors so they can achieve their potential needs substantial efforts in (a) chemical functionalization of the sensor, (b) mechanical transduciton of the binding events, and (c) integration of the sensors into larger systems. In this talk we will focus on our groups efforts at developing new ultransensitive paradigms for mechanical transduction of binding events. We will focus on our results on the use of (i) higher cantilever modes, (ii) the used of carbon nanotube whistered cantilevers, (iii)the development of mode localization sensors and (iv) the performance of cantilever sensors under liquids.
Introduction to VEDA: Virtual Environment for Dynamic AFM
26 Sep 2007 | Teaching Materials | Contributor(s): Arvind Raman
This resource has become outdated and has been retired by agreement with the author. Please see the VEDA tool page and supporting documents for current information regarding the VEDA Tool.
This learning module describes the motivation, theory, and features of
VEDA- a Virtual Environment for Dynamic Atomic Force Microscopy for the
accurate simulation of dynamic AFM on organic and inorganic surfaces.
Following the motivation and theory, two specific examples are
illustrated, one using the Dynamic Approach Curve (DAC) tool and another
using the Amplitude Modulated Scanning (AMS) tool. The first example
explores how VEDA can be used to understand the imaging forces applied
to a polymer sample in dynamic AFM while the second illustrates how both
changes in elasticity as well as viscosity over different parts of a
polymer sample can lead to different extents of phase contrast.
ME 597 Homework 3:
29 Dec 2010 | Teaching Materials | Contributor(s): Arvind Raman
- Steady state vibration response far from sample
- Attractive and repulsive regimes of oscillation
- Practical issues