Calculation of the Matrix Elements for Alloy Scattering

31 Dec 2012 | Publications | Contributor(s): Saumitra Raj Mehrotra

An appendix to the paper "Atomistic approach to alloy scattering in Si1−xGex," Appl. Phys. Lett. 98, 173503 (2011). It involves the generic derivation for the matrix element calculation for the alloy disorder scattering.

BJT Lab Worked Out Problem 2

02 Feb 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This sample worked out problem simulated a pnp type BJT in Common Base configuration and calculates AC and DC amplification ratios.

BJT Lab Worked Out Problem 1

01 Feb 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This sample worked out problem analyzes the output characteristic curves of an npn BJT transistor and extracts the relevant parameters.

BJT Lab - Amplifier

31 Jan 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This real life problem designs and calculates the AC amplification ratio for a Common-Emitter configuration npn type BJT.

Electron Density in a Nanowire

30 Jan 2011 | Animations | Contributor(s): Gerhard Klimeck, Saumitra Raj Mehrotra

Electron Density in a circular Silicon nanowire transistor.

MOSCAP CV profiling

05 Jan 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This real life problem based on MOSCAP allows one to understand the usage of CV profiling of MOS type of devices.

MOSFET Lab - Scaling

03 Jan 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck, Dragica Vasileska

The concept of device scaling and the need to control short channel effects is used in this real life problem

Crystal Viewer Tool Video Demonstration

14 Dec 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Lynn Zentner, Joseph M. Cychosz

This video shows the use of the Crystal Viewer Tool to visualize several material/crystal systems. The examples demonstrated will provide a first-time user with a basic understanding of how the tool works.

MOSFET Worked out problems 1

06 Dec 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

Short channel effects in a MOSFET due to channel length scaling are highlighted in this worked out problem.

Test for Quantum Dot Lab tool

09 Nov 2010 | Teaching Materials | Contributor(s): SungGeun Kim, Saumitra Raj Mehrotra

This test is aimed at self-learning students or instructors who may be engaged in teaching classes related to the quantum dot lab tool. The level of this test should not be difficult for a student who has gone through "the general tutorial to quantum dots," "the introductory tutorial to the …

ABACUS: Test for MOSFET Tool

18 Oct 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

Verification of the Validity of the MOSFET Tool

11 Oct 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Output characteristics of a bulk MOSFET are computed using MOSFET lab and compared with an analytical model based on Bulk-Charge theory. Parasitic resistance is used as a fitting parameter in the analytical model. MATLAB script used for verification is also available for download.

ABACUS: Test for BJT lab Tool

06 Oct 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning student or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

Carrier Statistics Lab Video Demonstration

23 Sep 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra

This video shows: Basic input deck for the tool, Simulation run of Temperature sweep with constant fermi level, Simulation run of Temperature sweep with constant doping.

Verification of the Validity of the BJT Tool

24 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

A pnp BJT in Common-Base configuration is analyzed both analytically and numerically using BJT Lab. DC current gain and Output characteristics are computed.MATLAB script used is also available for download.

MOSCAP Worked out problems (Basic)

19 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

A simple MOSCAP is analyzed under different operation modes namely: Accumulation, near threshold and Inversion.

Drift Diffusion Lab Worked out problems (Drift)

18 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

This sample worked out problem illustrated the concept of mobility. Mobility values are computed for different material and doping levels.

Drift Diffusion - Temperature Sensor

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The fact that mobility of a semiconductor varies with temperature is used to design a temperature sensor in this test.

Worked Examples for Carrier Statistics (basic)

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Several worked out examples are presented that illustrate the basic concept of carrier concentration in semiconductors.

ABACUS: Test for MOSCAP Tool

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

Worked Examples for Carrier Statistics (advanced)

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Two worked out examples based on Fermi-Dirac Vs Maxwell-Boltzmann statistics and temperature effects are presented.

Drift Diffusion Lab Worked out problems (Diffusion)

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

A sample problem is worked out using Drift-Diffusion lab. The problem statement deals with the concept of diffusion in semiconductors.

ABACUS: Test for Drift Diffusion Lab

12 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

Verification of the Validity of the Drift-Diffusion Lab Tool

11 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Drift-Diffusion Lab results are verified analytically. In the first test minority carrier concentration is computed in a semiconductor slab with constant carrier Generation rate (/cm3.s). In the second test bias is applied across a semiconductor slab and current is computed both analytically and …

Verification of the Validity of the MOSCap Tool

11 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Numerical results for Surface Potential Vs Gate Bias are compared with analytical results to prove the validity of MOSCap Lab.