Worked Examples for Carrier Statistics (advanced)

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Two worked out examples based on Fermi-Dirac Vs Maxwell-Boltzmann statistics and temperature effects are presented.

3D wavefunctions

12 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

In quantum mechanics the time-independent Schrodinger's equation can be solved for eigenfunctions (also called eigenstates or wave-functions) and corresponding eigenenergies (or energy levels) for a stationary physical system. The wavefunction itself can take on negative and positive values and …

ABACUS: Test for BJT lab Tool

06 Oct 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning student or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

ABACUS: Test for Carrier Statistics Tool

10 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

ABACUS: Test for Drift Diffusion Lab

12 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

ABACUS: Test for MOSCAP Tool

16 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

ABACUS: Test for MOSFET Tool

18 Oct 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The objective of this test is to give an idea to a self-learning students or to instructors in the case this test is used in a classroom the level of understanding of this topic when students have gone through the learning material, worked exercises and have completed the assignments and the …

BJT Lab

06 Feb 2008 | Tools | Contributor(s): Saumitra Raj Mehrotra, Abhijeet Paul, Gerhard Klimeck, Dragica Vasileska, Gloria Wahyu Budiman

This tool simulates a Bipolar Junction Transistor (BJT) using a 2D mesh. Powered by PADRE.

BJT Lab - Amplifier

31 Jan 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This real life problem designs and calculates the AC amplification ratio for a Common-Emitter configuration npn type BJT.

BJT Lab Worked Out Problem 1

01 Feb 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This sample worked out problem analyzes the output characteristic curves of an npn BJT transistor and extracts the relevant parameters.

BJT Lab Worked Out Problem 2

02 Feb 2011 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra

This sample worked out problem simulated a pnp type BJT in Common Base configuration and calculates AC and DC amplification ratios.

BJT Lab: First-Time User Guide

15 Jun 2009 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Benjamin P Haley

This first-time user guide provides introductory material to BJT on nanoHUB. It includes a tour of the Rappture interface, which notes key inputs and typical outputs, and an introduction to the workings of NPN and PNP type BJT. We discuss the default simulation (what happens if you don't change …

Buckyball C60

09 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

A fullerene is any molecule composed entirely of carbon, and can take the form of hollow spheres, ellipsoids, or tubes. Spherical fullerenes (often referred to as "buckyballs") are one of the known structurally different form of carbon. C60 are the most common of buckyball structures. …

Calculation of the Matrix Elements for Alloy Scattering

28 Dec 2012 | Publications | Contributor(s): Saumitra Raj Mehrotra

An appendix to the paper "Atomistic approach to alloy scattering in Si1−xGex," Appl. Phys. Lett. 98, 173503 (2011). It involves the generic derivation for the matrix element calculation for the alloy disorder scattering.

Carbon nanotube bandstructure

09 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

Carbon nanotubes are allotropes of carbon with a cylindrical nanostructure, and can be categorized into single-walled nanotubes (SWNT) and multi-walled nanotubes (MWNT). These cylindrical carbon molecules have novel properties that make them potentially useful in many nanotechnology applications, …

Carrier Statistics - Temperature Effects

10 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

Silicon (Si), Germanium (Ge) and Gallium-Arsenide (GaAs) are commonly used materials for MOS Field Effect Transistor (MOSFET) fabrication. MOSFET structures are commonly doped to achieve the desired switching operation and doping is a critical parameter in MOSFET designing. The goal in this test is …

Carrier Statistics Lab

08 Jan 2008 | Tools | Contributor(s): Saumitra Raj Mehrotra, Abhijeet Paul, Gerhard Klimeck

Calculate the electron & hole density in semiconductors

Carrier Statistics Lab Video Demonstration

21 Sep 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra

This video shows: Basic input deck for the tool, Simulation run of Temperature sweep with constant fermi level, Simulation run of Temperature sweep with constant doping.

Carrier Statistics Lab: First-Time User Guide

05 Mar 2009 | Teaching Materials | Contributor(s): Abhijeet Paul, Gerhard Klimeck, Benjamin P Haley, Saumitra Raj Mehrotra

This first-time user guide is an introduction to the Carrier Statistics Lab . It provides basic definitions, guidance on how to run the tool, and suggested exercises to help users get accustomed to the idea of distribution functions as well as how these functions are used in determining the …

Carrier Statistics Tool Verification

09 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

This test verifies the Carrier Statistics Tool by comparing the numerically computed and analytically extracted, electron and hole carrier densities. The results are close within 2% of margin.

Crystal Viewer Tool

22 Dec 2007 | Tools | Contributor(s): Saumitra Raj Mehrotra, Michael Povolotskyi, Sebastian Steiger, Tillmann Christoph Kubis, Abhijeet Paul, Xingshu Sun, Victoria Savikhin, Gerhard Klimeck

Visualize different crystal lattices and planes

Crystal Viewer Tool Video Demonstration

30 Nov 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Lynn Zentner, Joseph M. Cychosz

This video shows the use of the Crystal Viewer Tool to visualize several material/crystal systems. The examples demonstrated will provide a first-time user with a basic understanding of how the tool works.

CV profile with different oxide thickness

10 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. C-V measurements …

Diffusion of holes and electrons

10 Apr 2010 | Animations | Contributor(s): Saumitra Raj Mehrotra, Gerhard Klimeck

Diffusion is a process of particles distributing themselves from regions of high- to low- concentrations. In semi-classical electronics these particles are the charge carriers (electrons and holes). The rate at which a carrier can diffuse is called diffusion constant with units of cm2/s. The image …

Drift Diffusion - Temperature Sensor

13 Aug 2010 | Teaching Materials | Contributor(s): Saumitra Raj Mehrotra, Dragica Vasileska, Gerhard Klimeck

The fact that mobility of a semiconductor varies with temperature is used to design a temperature sensor in this test.