12 Dec 2006 | Teaching Materials | Contributor(s): Lynn Marie Santiago
This is the fourth contribution from the students in the University of Texas at El Paso Molecular Electronics course given in the fall of 2006.
This presentation is presented at the undergraduate level and introduces spectroscopic ellipsometry, which is one of the most important characterization methods for molecular electronics according to James and Tour of Rice University. Ellipsometry is an optical method for measuring film thickness, number of layers, and surface inhomogeneity. The ...