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Nanotechnology for Aerospace Research: Surface Science Applications
29 Mar 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray photoelectron spectroscopy (XPS), scanning tunneling microscopy/spectroscopy (STM), high–resolution electron energy loss spectroscopy (HREELS), low energy electron diffraction (LEED).
XPS Thickness Solver
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18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications
01 Nov 2011 | Online Presentations | Contributor(s): Dmitry Zemlyanov
ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis
09 Mar 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
16 Feb 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov
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