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Home Members John Weaver


  • Organization
    Purdue University

  • Employment Type

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  • Address(es)
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  • Biography

    John Weaver serves as the Facility Manager for the Birck
    Nanotechnology Center at Purdue University. He is responsible for
    the facility infrastructure, safety and training activities, and
    cleanroom and laboratory operations. John received his BS degree in
    Chemistry at Adrian College in 1972, and joined RCA Solid State
    Division in process engineering in the world’s first production CMOS
    fabrication facility. In 1975 he moved to Hughes Aircraft Company’s
    Solid State Products Division in Newport Beach, California, where he
    continued his role in high-volume manufacturing-support engineering.
    In 1977, he moved to what is now Delphi Corporation in Kokomo,
    Indiana. During his career, John has been involved in a variety of
    roles in semiconductor process support, process development, and
    processing facilities development. John has published numerous
    papers in both the process development and contamination control
    fields, has two patents in process development, and authored a book
    and a book chapter in contamination control technology. He has
    taught a wide variety of industry short-courses, and is the recipient
    of the Willis J. Whitfield Award for contributions to the field of
    contamination control. He is a Senior Member of the Institute for
    Environmental Sciences and Technology, President of the Indiana
    Chapter, member of the Editorial Board for the Journal of the IEST,
    and is a Principal Member of the NFPA 318 committee, which writes
    fire standards for cleanrooms. He has been involved in the design,
    construction, and/or operation of more than 25 cleanrooms and clean
    facilities during his career.

  • Interests
    Enter your Interests., a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.