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ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
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Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology
27 Feb 2006 | Online Presentations | Contributor(s): Eric Stach
This tutorial presents a broad overview of the basic physical principles of techniques used in scanning electron microscopy (SEM), as well as their application to understanding processing/structure/property relationships in nanostructured materials. Special emphasis is placed on the capabilities …
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MSE 582 Lecture 10: Diffraction Contrast Imaging
13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM
14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach
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MSE 582 Lecture 12: Analytical Electron Microscopy
15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach