ECET 499N Lecture 8: Electron Microscopy

02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

Guest lecture: Eric A. Stach

Electron and Ion Microscopies as Characterization Tools for Nanoscience and Nanotechnology

27 Feb 2006 | Online Presentations | Contributor(s): Eric Stach

This tutorial presents a broad overview of the basic physical principles of techniques used in scanning electron microscopy (SEM), as well as their application to understanding processing/structure/property relationships in nanostructured materials. Special emphasis is placed on the capabilities …

MSE 582 Lecture 10: Diffraction Contrast Imaging

13 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

14 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 12: Analytical Electron Microscopy

15 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 1: Introduction

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 4: The Instrument, Part 1

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 4: The Instrument, Part 2

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 5: Electron Detection

04 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 6: Vacuum Science in EM

28 Jan 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 7: Sample Preperation

11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 8: Electron Scattering

11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Lecture 9: Diffraction

11 Feb 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 582 Transmission Electron Microscopy Skills

28 Jan 2008 | Courses | Contributor(s): Eric Stach

Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.

MSE 640 Lecture 11: Diffraction contrast imaging

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

Thickness fringes, Bend contours, Planar faults

MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

MSE 640 Lecture 13: Diffraction contrast imaging

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

Weak beam dark field imaging, Simulation of diffraction contrast

MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

29 May 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 640 Lecture 17: STEM Imaging

27 May 2008 | Online Presentations | Contributor(s): Eric Stach

Much of the material for this class is courtesy of Nigel Browning of UC Davis & LLNL and Dave Muller of Cornell.

MSE 640 Lecture 18: X-ray production in the TEM

28 May 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

28 May 2008 | Online Presentations | Contributor(s): Eric Stach

MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

28 May 2008 | Online Presentations | Contributor(s): Eric Stach