Support

Support Options

Submit a Support Ticket

 

Usage

Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 9
Total "and more" Users Served: 2,790
Rank by Contributions: 120 / 1458
First Contribution: 01 Jul 2008
Last Contribution: 29 Mar 2012
Citations on Contributions: 3
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
No data found.
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3) Online Presentations 193 438 - 29 Mar 2012
2 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3) Online Presentations 355 712 - 29 Mar 2012
3 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling Courses 611 1,177 - 29 Mar 2012
4 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3) Online Presentations 255 457 - 29 Mar 2012
5 A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells Online Presentations 90 303 1 16 Aug 2011
6 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011) Online Presentations 139 683 - 11 May 2011
7 Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations 130 607 2 02 May 2011
8 On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations 117 460 - 30 Dec 2009
9 Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations 14 191 - 01 Jul 2008
TOTAL 952 2,790
* Total only includes versions of the tools this author contributed to.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.