On Monday July 6th, the nanoHUB will be intermittently unavailable due to scheduled maintenance. We apologize for any inconvenience this may cause. close

Support

Support Options

Submit a Support Ticket

 

Usage

Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 9
Total "and more" Users Served: 3,322
Rank by Contributions: 122 / 1559
First Contribution: 01 Jul 2008
Last Contribution: 29 Mar 2012
Citations on Contributions: 4
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
No data found.
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3) Online Presentations 229 862 - 29 Mar 2012
2 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling Courses 507 1,520 1 29 Mar 2012
3 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3) Online Presentations 265 638 - 29 Mar 2012
4 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3) Online Presentations 160 555 - 29 Mar 2012
5 A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells Online Presentations 68 344 1 16 Aug 2011
6 Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011) Online Presentations 123 771 - 11 May 2011
7 Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations 157 718 2 02 May 2011
8 On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations 65 492 - 30 Dec 2009
9 Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations 11 197 - 01 Jul 2008
TOTAL 818 3,322
* Total only includes versions of the tools this author contributed to.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.