Dr. Sardela holds a Ph.D. in Materials Science and Technology (Linkoping University, Sweden, 1994) with emphasis in x-ray scattering and characterization of semiconductor materials. He worked four years in industrial analytical laboratories in the Silicon Valley, California. Over the past 10 years, Dr. Sardela has been a Senior Research Scientist and manager of the x-ray analytical facilities at the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.