[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry

05 Jul 2012 | Online Presentations | Contributor(s): Mauro Sardela

This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will cover the following techniques: Atomic force microscopy (AFM) X-ray diffraction, reflectivity and …

X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray …