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Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 2
Total "and more" Users Served: 1,249
Rank by Contributions: 473 / 1499
First Contribution: 29 Dec 2009
Last Contribution: 05 Jul 2012
Citations on Contributions: -
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
No data found.
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 [Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 4: X-ray Diffraction and Reflectometry Online Presentations 24 37 - 05 Jul 2012
2 X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials Online Presentations 198 1,221 - 29 Dec 2009
TOTAL 215 1,249
* Total only includes versions of the tools this author contributed to., a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.