1. Atomic Force Microscope Investigations of Lubrication Layers

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   26 Nov 2012 | Notes | Contributor(s): Brian Demczyk

   This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.

2. Boron Nitride Nanotube Growth Mode

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   27 Jan 2012 | Publications | Contributor(s): Brian Demczyk

   This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques. This research was supported in part by the Director of the Office of …

3. Boron Nitride Nanotube Structure

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.

4. Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.

5. Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.

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