1. Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.

2. In-situ carbon nanotube tensile test

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   07 Oct 2011 | Animations | Contributor(s): Brian Demczyk

   This represents the first in-situ tensile test observed in a transmission electron microscope.

3. Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.

4. Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on hydrogen-terminated @100# silicon substrates. Coauthors: V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

5. Boron Nitride Nanotube Structure

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   07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

   We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.

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