Oxygen Sensitivity of Single Walled Carbon nanotubes
27 Mar 2023 | Papers | Contributor(s): Brian Demczyk
Demonstrates oxygen adsorption capabilities of single walled carbon nanotubes.
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | Papers | Contributor(s): Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
Nanostructure of Perpendicular Recording Media
26 Sep 2012 | Papers | Contributor(s): Brian Demczyk
This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | Papers | Contributor(s): Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
On the Two to Three Dimensional Growth Transition in Strained Silicon Germanium Thin Films
Utilizing a model adapted from classical nucleation theory [8], we calculate a "critical thickness" for island formation, taking into account the surfaceenergies of the deposit and the substrate and the elastic modulus of the deposit, to which experimental results for CVD grown silicon germanium...
Surface structure and composition of high-surface-area molybdenum nitrides
02 Feb 2012 | Papers | Contributor(s): Brian Demczyk, j. G. Choi, L. T. Thompson
In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.
Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
30 Jan 2012 | Papers | Contributor(s): Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
Boron Nitride Nanotube Growth Mode
27 Jan 2012 | Papers | Contributor(s): Brian Demczyk
This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques.This research was supported in part by the Director of the Office of...
Lubrication Effects on Head-Disk Spacing Loss
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. Liu, C. Y. Chen, S. Zhang
The effects of lubrication thickness on the magnetic recording head-media tribology were investigated in this study.
Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, R. Naik, G. Auner, C. Kota, U. Rao
Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.
Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, Y.M. Wang, J. Cumings, M. Hetman, W. Han, A. Zettl. R. O. Ritchie
This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.
Oxidation Behavior of CoCr Thin Films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk
In this work, elemental redistribution of annealed CoCr thin films has been investigated by X-ray photoelectron spectroscopy.
Magnetic properties of magnetron sputtered Co-Cr thin films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. O. Artman
The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy
Origin of the orientation ratio in sputtered longitudinal media
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen
The surface morphology, thin film microstructure, and crystallography of sputtered longitudinalmedia were examined by atomic force and transmission electron microscopy.
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.
Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es
We have employed reflection high energy electron diffraction (RHEED) and high resolutiontransmission electron microscopy (HREM) to study Cu films grown on hydrogen terminatedSi( 100) and Si( 111) substrates by molecular beam epitaxy.
Boron Nitride Nanotube Structure
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. Cumings, A. Zettl
We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.