Atomic Force Microscope Investigations of Lubrication Layers

26 Nov 2012 | Notes | Contributor(s): Brian Demczyk

This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.

On the Origin of the Orientation Ratio in Sputtered Longitudinal Media

26 Oct 2012 | Notes | Contributor(s): Brian Demczyk

This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by transmission …

Nanoscale Dimensions in Hard Disk Media

27 Sep 2012 | Notes | Contributor(s): Brian Demczyk

This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear. Samples were synthesized …

Nanostructure of Perpendicular Recording Media

26 Sep 2012 | Publications | Contributor(s): Brian Demczyk

This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.

Surface structure and composition of high-surface-area molybdenum nitrides

02 Feb 2012 | Publications | Contributor(s): Brian Demczyk

In this work, we have employed high-resolution transmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy to determine the near-surface structures and compositions of a series of molybdenum nitride catalysts.

On the Two to Three Dimensional Growth Transition in Strained Silicon Germanium Thin Films

02 Feb 2012 | Publications | Contributor(s): Brian Demczyk

Utilizing a model adapted from classical nucleation theory [8], we calculate a "critical thickness" for island formation, taking into account the surface energies of the deposit and the substrate and the elastic modulus of the deposit, to which experimental results for CVD grown silicon germanium …

Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

02 Feb 2012 | Publications | Contributor(s): Brian Demczyk

In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.

Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

30 Jan 2012 | Publications | Contributor(s): Brian Demczyk

This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

Boron Nitride Nanotube Growth Mode

27 Jan 2012 | Publications | Contributor(s): Brian Demczyk

This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques. This research was supported in part by the Director of the Office of …

Boron Nitride Nanotube Structure

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.

Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

We have employed reflection high energy electron diffraction (RHEED) and high resolution transmission electron microscopy (HREM) to study Cu films grown on hydrogen terminated Si( 100) and Si( 111) substrates by molecular beam epitaxy. Coauthors: R. Naik, G. W. Auner, C. Kota, U. Rao

Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on hydrogen-terminated @100# silicon substrates. Coauthors: V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

Origin of the orientation ratio in sputtered longitudinal media

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

The surface morphology, thin film microstructure, and crystallography of sputtered longitudinal media were examined by atomic force and transmission electron microscopy. Coauthors: J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen

Magnetic properties of magnetron sputtered Co-Cr thin films

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attention to the various contributions to the film anisotropy Coauthor: J. O. Artman

Oxidation Behavior of CoCr Thin Films

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

In this work, elemental redistribution of annealed CoCr thin films has been investigated by X-ray photoelectron spectroscopy.

Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.

Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.

Lubrication Effects on Head-Disk Spacing Loss

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

The effects of lubrication thickness on the magnetic recording head-media tribology were investigated in this study.

In-situ carbon nanotube tensile test

07 Oct 2011 | Animations | Contributor(s): Brian Demczyk

This represents the first in-situ tensile test observed in a transmission electron microscope.