Direct mechanical measurement of the tensile strength and elastic modulus of multiwalled carbon nanotubes
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, Y.M. Wang, J. Cumings, M. Hetman, W. Han, A. Zettl. R. O. Ritchie
This work represents the first in-situ measurenment of the tensile strength of a carbon nanotuube.
In-situ carbon nanotube tensile test
07 Oct 2011 | Animations | Contributor(s): Brian Demczyk
This represents the first in-situ tensile test observed in a transmission electron microscope.
Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, R. Naik, G. Auner, C. Kota, U. Rao
Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.
In-situ Carbon Nanotube Bending Tests
02 Jun 2013 | Animations | Contributor(s): Brian Demczyk
This video shows a series of in-situ TEM bending manipulations on carbon nanotubes, demonstrating the remarkable flexibility of these materials.
Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es
We have employed reflection high energy electron diffraction (RHEED) and high resolutiontransmission electron microscopy (HREM) to study Cu films grown on hydrogen terminatedSi( 100) and Si( 111) substrates by molecular beam epitaxy.
Structure and Morphology of Silicon-Germanium Thin Films
07 Feb 2015 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the growth of (Si,Ge & SiGe) thin films on Si and Ge (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition (UHVCVD). Thin films were characterized structurally by conventional and high-resolution transmission electron microscopy (TEM) and...
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | Papers | Contributor(s): Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
Lubrication Effects on Head-Disk Spacing Loss
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. Liu, C. Y. Chen, S. Zhang
The effects of lubrication thickness on the magnetic recording head-media tribology were investigated in this study.
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.
Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | Papers | Contributor(s): Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
Surface structure and composition of high-surface-area molybdenum nitrides
02 Feb 2012 | Papers | Contributor(s): Brian Demczyk, j. G. Choi, L. T. Thompson
In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.
Oxidation Behavior of CoCr Thin Films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk
In this work, elemental redistribution of annealed CoCr thin films has been investigated by X-ray photoelectron spectroscopy.
Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns
30 Jan 2012 | Papers | Contributor(s): Brian Demczyk, D. E. Laughlin
This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.
Boron Nitride Nanotube Growth Mode
27 Jan 2012 | Papers | Contributor(s): Brian Demczyk
This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques.This research was supported in part by the Director of the Office of...
Boron Nitride Nanotube Structure
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. Cumings, A. Zettl
We have used high-resolution transmission electron microscopy to resolve the basal plane structure and chirality relationships in boron nitride nanotubes.
Structure and Properties of Carbon and Boron Nitride Nanotubes
10 Jan 2014 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes structure and mechanical property determinations on carbon and boron nitride (sp2-bonded) nanotubes , as deduced by transmission electron microscopy.
Magnetic properties of magnetron sputtered Co-Cr thin films
07 Oct 2011 | Papers | Contributor(s): Brian Demczyk, J. O. Artman
The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy
Interface Structure/Surface Morphology of (Co,Fe,Ni)/Cu/Si Thin Films
25 Mar 2014 | Presentation Materials | Contributor(s): Brian Demczyk, R. Naik, A. Lukaszew, G. W. Auner, V. M. Naik
The effects of thin film and interfacial stress on the magnetic properties Fe, Co and Ni films deposited by molecular beam epitaxy on Cu underlayers (Si substrate) were examined, employing transmission,ans scanning probe microscopy and reflection high energy diffraction. It ws found that the...
Novel EM Nanoscale Techniques
27 Nov 2017 | Presentation Materials | Contributor(s): Brian Demczyk
Describes unconventional use of conventional techniques (SAD,CBED, HREM and Fourier analysis) to elucidate hard-to-access structural information at the nano scale.
On the Origin of the Orientation Ratio in Sputtered Longitudinal Media
26 Oct 2012 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation discusses the influence of processing on the development of nanostructural features and their relationship to the orientation ratio, which is of importance in determining magnetic properties in longitudinal recording media. fabricated hard disks were characterized by...
Ferroelectric Domain Motion
07 May 2018 | Animations | Contributor(s): Brian Demczyk
Videos show total ferroelectric domain disappearance in bulk La-doped lead titanate, and incomplete reversal in a small (< 0.5 micrometer) grain, when heated through the Curie point.
Nanostructure of Perpendicular Recording Media
26 Sep 2012 | Papers | Contributor(s): Brian Demczyk
This write up examines the nanostructure of successive generations of perpendicular recording media, with particular emphasis on defects and elemental segregation.
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.