1. Modeling Interface-defect Generation (MIG)

   PLG_GROUPS_RESOURCES_THIS_HAS 9.4 Ranking

   Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

   Usage Stats

   total: updated 18 May 2013
   Users:	410
   Jobs:	3652
   Avg. exec. time:	28 secs

   Reviews & Citations

   Google/IEEE
   Avg. Review:	4.0 out of 5 stars
   Citations:

   18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

   Analyzes device reliability based on NBTI

2. SMC published

   PLG_GROUPS_RESOURCES_THIS_HAS 5.1 Ranking

   Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

   Usage Stats

   total: updated 18 May 2013
   Users:	30
   Jobs:	250
   Avg. exec. time:	10 mins

   Reviews & Citations

   Google/IEEE
   Avg. Review:	0.0 out of 5 stars
   Citations:

   01 Mar 2006 | Tools | Contributor(s): jeff bude, kent smith, Steven Clark, HALDUN KUFLUOGLU, dhanoop varghese, Nauman Zafar Butt

   Simplex Monte Carlo - solves for hot electron and hole distribution functions (DF) given input PADRE solution and mesh files.

Top 2 shown