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HALDUN KUFLUOGLU

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  1. Modeling Interface-defect Generation (MIG)

    4.0 out of 5 stars 

    18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

  2. SMC published

    07 Apr 2005 | Tools | Contributor(s): jeff bude, kent smith, Steven Clark, HALDUN KUFLUOGLU, dhanoop varghese, Nauman Zafar Butt

    Simplex Monte Carlo - solves for hot electron and hole distribution functions (DF) given input ...

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