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1. Modeling Interface-defect Generation (MIG)

   18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam

   Analyzes device reliability based on NBTI

2. SMC

   01 Mar 2006 | Tools | Contributor(s): jeff bude, kent smith, Steven Clark, HALDUN KUFLUOGLU, dhanoop varghese, Nauman Zafar Butt

   Simplex Monte Carlo - solves for hot electron and hole distribution functions (DF) given input PADRE solution and mesh files.

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