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Modeling Interface-defect Generation (MIG)
18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam
Analyzes device reliability based on NBTI
01 Mar 2006 | Tools | Contributor(s): jeff bude, kent smith, Steven Clark, HALDUN KUFLUOGLU, dhanoop varghese, Nauman Zafar Butt
Simplex Monte Carlo - solves for hot electron and hole distribution functions (DF) given input PADRE solution and mesh files.
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