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[Illinois] Advanced Materials Characterization Workshop 2015
19 Aug 2015 | Workshops | Contributor(s): Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin
AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.Sessions focused on...
[Illinois] Secondary Ion Mass Spectroscopy
18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila
[Illinois] Rutherford Backscattering Spectroscopy
[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 5: Secondary Ion Mass Spectrometry/Rutherford Backscattering
05 Jul 2012 | Online Presentations | Contributor(s): Timothy P. Spila
Secondary ion mass spectrometry is an analytical technique based on the measurement of themass of ions ejected from a solid surface after the surface has been bombarded with high energy (1-25 keV) primary ions.
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