[Illinois] Advanced Materials Characterization Workshop 2015
19 Aug 2015 | Workshops | Contributor(s): Ted Limpoco, Scott Speakman, Timothy P. Spila, Rick Haasch, Justin Masone, Kathy Walsh, Matthew Bresin
AMC 2015 provided a critical, comparative and condensed overview of major analytical techniques for materials characterization with emphasis on practical applications. Lectures covered basic and advanced topics geared towards both novice and experienced scientists.Sessions...
[Illinois] Secondary Ion Mass Spectroscopy
18 Aug 2015 | Online Presentations | Contributor(s): Timothy P. Spila
[Illinois] Rutherford Backscattering Spectroscopy
[Illinois] Advanced Materials Characterization Workshop 2012: Tutorial 5: Secondary Ion Mass Spectrometry/Rutherford Backscattering
05 Jul 2012 | Online Presentations | Contributor(s): Timothy P. Spila
Secondary ion mass spectrometry is an analytical technique based on the measurement of themass of ions ejected from a solid surface after the surface has been bombarded with high energy (1-25 keV) primary ions.
Top 4 shown