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Homework for PN Junctions: Depletion Approximation (ECE 305)
06 Jan 2006 | Teaching Materials | Contributor(s): Mark Lundstrom, David Janes
This homework assignment is part of ECE 305 "Semiconductor Device Fundamentals" (Purdue University). It contains 7 problems which lead students through a comparison of the depletion approximation and the exact analysis of a PN junction diode.
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Semiconductor Interfaces at the Nanoscale
17 Oct 2005 | Online Presentations | Contributor(s): David Janes
The trend in downscaling of electronic devices and the need to add functionalities such as sensing and nonvolatile memory to existing circuitry dictate that new approaches be developed for device structures and fabrication technologies. Various device technologies are being investigated, including …
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Novel Magnetic Materials for Biomolecular Diagnostics
28 Jul 2005 | Online Presentations | Contributor(s): David Janes, Gil Lee, Sugata Bhattacharya, Kyung J. Jeong, D. M. Oh, W. S. Chang
Paramagnetic particles have emerged as important tools for cell sorting,
protein separation, and single molecule measurements. The particles used in
these applications must meet the following requirements: uniform in size,
highly paramagnetic, stable in physiological salt buffer, …
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Surface Analysis of Organic Monlayers Using FTIR and XPS
02 Aug 2006 | Online Presentations | Contributor(s): Jamie Nipple, Michael Toole, David Janes
Current research concerning self-assembled monolayers (SAM) focuses on the fabrication of microelectronics utilizing a semiconductor/molecule/metal junction. This study seeks to investigate various experimental techniques for creation of organic monolayers by surface analysis techniques including …
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BNC Annual Research Symposium: Nanoelectronics and Semiconductor Devices
23 Apr 2007 | Online Presentations | Contributor(s): David Janes
This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.