Analysis of Techniques for Measuring Carrier Recombination Lifetime
27 Nov 2013 | Online Presentations | Contributor(s): Richard Keith Ahrenkiel
Rapid, accurate and contactless measurement of the recombination lifetime is a very important activity in photovoltaics. The excess carrier lifetime (Δn(t)) is the most critical and variable parameter in the development of photovoltaic materials. Device performance can be accurately predicted from the lifetime measurement of the starting material. However, there is no single measurement that directly measures the bulk lifetime as all measurements are based on a device model.