Characterization of BTI induced variability in scaled Metal Gate / High-K CMOS technologies
27 Nov 2013 | Online Presentations | Contributor(s): Andreas Kerber
In this presentation, we will focus on the characterization challenges related to stochastic BTI process in small area CMOS devices and discuss the large scale data we collected on discrete SRAM and logic devices. Finally we will elaborate on the impact of BTI induced variability on End-of-Life...
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