Ahmad Ehteshamul Islam
Usage
Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.
| Item | Value |
|---|---|
| Contributions: | 6 |
| Total Simulation Users Served: | 214 |
| Total "and more" Users Served: | 660 |
| Rank by Contributions: | 111 / 1031 |
| First Contribution: | 28 Aug 2006 |
| Last Contribution: | 30 Sep 2011 |
| Citations on Contributions: | 1 |
| # | Tool Name | Users served in last 12 months | Simulation Runs in last 12 months | Total users served | Total Simulation Runs | Citations | Published On |
|---|---|---|---|---|---|---|---|
| 1 | Modeling Interface-defect Generation (MIG) | 55 | 1,046 | 357 | 2,708 | 1 | 28 Aug 2006 |
| total | 60 | 1,046 | 214 | 2,708 |
| # | Resource Title | Users served in last 12 months | Total users served | Citations | Published On |
|---|---|---|---|---|---|
| 1 | Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Publications | 48 | 48 | - | 30 Sep 2011 |
| 2 | Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations | 195 | 195 | - | 01 May 2011 |
| 3 | Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations | 76 | 163 | - | 31 Dec 2009 |
| 4 | On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations | 118 | 221 | - | 30 Dec 2009 |
| 5 | Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations | 41 | 148 | - | 01 Jul 2008 |
| total | 387 | 660 |