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Usage

Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 6
Total Simulation Users Served: 351
Rank by Contributions: 166 / 1448
First Contribution: 28 Aug 2006
Last Contribution: 30 Sep 2011
Citations on Contributions: 5
Usage in Courses/Classrooms: 63 users served in 8 courses from 4 institutions
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
1 Modeling Interface-defect Generation (MIG) 33 351 494 4,971 3 28 Aug 2006
TOTAL 33 351 351 4,971
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Publications 149 527 - 30 Sep 2011
2 Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations 155 558 2 02 May 2011
3 Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations 36 254 - 31 Dec 2009
4 On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations 96 421 - 30 Dec 2009
5 Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations 12 185 - 01 Jul 2008
* Total only includes versions of the tools this author contributed to.

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