Usage
Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.
| Item | Value |
|---|---|
| Contributions: | 6 |
| Total Simulation Users Served: | 267 |
| Total "and more" Users Served: | 957 |
| Rank by Contributions: | 142 / 1266 |
| First Contribution: | 28 Aug 2006 |
| Last Contribution: | 30 Sep 2011 |
| Citations on Contributions: | 5 |
| Usage in Courses/Classrooms: | 18 users served in 7 courses from 4 institutions |
| # | Tool Name | Users served in last 12 months | Simulation Runs in last 12 months | Total users served | Total Simulation Runs | Citations | Published On |
|---|---|---|---|---|---|---|---|
| 1 | Modeling Interface-defect Generation (MIG) | 53 | 844 | 410 | 3,652 | 3 | 28 Aug 2006 |
| total | 53 | 844 | 267 | 3,652 |
| # | Resource Title | Users served in last 12 months | Total users served | Citations | Published On |
|---|---|---|---|---|---|
| 1 | Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Publications | 214 | 367 | - | 30 Sep 2011 |
| 2 | Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations | 105 | 387 | 2 | 01 May 2011 |
| 3 | Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations | 33 | 209 | - | 31 Dec 2009 |
| 4 | On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations | 52 | 330 | - | 30 Dec 2009 |
| 5 | Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations | 20 | 165 | - | 01 Jul 2008 |
| total | 176 | 957 |