Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.
|Total "and more" Users Served:||2,284|
|Rank by Contributions:||195 / 1881|
|First Contribution:||28 Aug 2006|
|Last Contribution:||30 Sep 2011|
|Citations on Contributions:||5|
|Usage in Courses/Classrooms:||63 users served in 8 courses from 4 institutions|
|#||Tool Name||Users served in last 12 months||Simulation Runs in last 12 months||Total users served||Total Simulation Runs||Citations||Published On|
|1||Modeling Interface-defect Generation (MIG)||41||421||604||8,296||3||28 Aug 2006|
|#||Resource Title||Users served in last 12 months||Total users served||Citations||Published On|
|1||Theory and characterization of random defect formation and its implication in variability of nanoscale transistors Papers||69||804||-||30 Sep 2011|
|2||Essential Aspects of Negative Bias Temperature Instability (NBTI) Online Presentations||75||852||2||02 May 2011|
|3||Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors Online Presentations||5||299||-||31 Dec 2009|
|4||On the Resolution of Ultra-fast NBTI Measurements and Reaction-Diffusion Theory Online Presentations||29||556||-||30 Dec 2009|
|5||Mobility Variation Due to Interface Trap Generation in Plasma Oxynitrided PMOS Devices Online Presentations||6||210||-||01 Jul 2008|
* Total only includes versions of the tools this author contributed to.