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Peter Griffin

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Contributions

Contributions

Tools (1-4 of 4)

  1. Process Lab: Point Defect Coupled Diffusion

    PLG_GROUPS_RESOURCES_THIS_HAS 8.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    total: updated 24 May 2013
    Users: 235
    Jobs: 1963
    Avg. exec. time: 2 secs
    Reviews & Citations
    Google/IEEE
    Avg. Review: 3.0 out of 5 stars
    Citations:

    09 Oct 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the point-defect-coupled diffusion process in integrated circuit fabrication

  2. Process Lab: Concentration Dependent Diffusion

    PLG_GROUPS_RESOURCES_THIS_HAS 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    total: updated 24 May 2013
    Users: 906
    Jobs: 24935
    Avg. exec. time: 2 secs
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    09 Oct 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the dopant diffusion process in integrated circuit fabrication

  3. Process Lab: Oxidation

    PLG_GROUPS_RESOURCES_THIS_HAS 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    total: updated 24 May 2013
    Users: 732
    Jobs: 21447
    Avg. exec. time: 35 mins
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations:

    09 Oct 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the oxidation process in integrated circuit fabrication

  4. Process Lab: Oxidation Flux

    PLG_GROUPS_RESOURCES_THIS_HAS 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    total: updated 24 May 2013
    Users: 300
    Jobs: 2592
    Avg. exec. time: 2 hours
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    09 Oct 2006 | Tools | Contributor(s): Shuqing (Victor) Cao, Yang Liu, Peter Griffin

    Simulates the oxidation flux in the oxide growth process in integrated circuit fabrication

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