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Usage

Usage is calculated on the last day of every month. For more information on usage data, visit the Usage Overview page.

Table 1: Overview
Item Value
Contributions: 8
Total Simulation Users Served: 95
Total "and more" Users Served: 8,825
Rank by Contributions: 125 / 1473
First Contribution: 26 Feb 2007
Last Contribution: 10 Jan 2012
Citations on Contributions: 1
Table 2: Simulation Tool Usage
# Tool Name Users served in last 12 months Simulation Runs in last 12 months Total users served Total Simulation Runs Citations Published On
1 XPS Thickness Solver 32 105 95 630 1 10 Jan 2012
TOTAL 31 105 95 630
Table 3: "and more" Usage
# Resource Title Users served in last 12 months Total users served Citations Published On
1 BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications Online Presentations 23 95 - 01 Nov 2011
2 ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis Online Presentations 98 214 - 09 Mar 2010
3 Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG Online Presentations 70 377 - 16 Feb 2010
4 X-ray Photoelectron Spectroscopy (XPS) Tour Online Presentations 166 2,234 - 24 Jan 2008
5 BME 695N Lecture 12: Introduction to X-ray Photoelectron Spectroscopy and the Examples of Biologically-Relevant Applications Online Presentations 62 839 - 19 Oct 2007
6 Introduction to X-ray Photoelectron Spectroscopy and to XPS Applications Online Presentations 509 5,994 - 17 May 2007
7 Introduction to X-ray Photoelectron Spectroscopy and XPS Application for Biologically Related Objects Online Presentations 59 1,037 - 26 Feb 2007
TOTAL 813 8,825
* Total only includes versions of the tools this author contributed to.

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.