1. ECE 695A Lecture 20: Reliability Measurements

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   07 May 2013 | Online Presentations | Contributor(s): Muhammad Alam

   To be recorded at a later date.

2. ECE 695A Lecture 40: Failure Analysis and Epilogue

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   07 May 2013 | Online Presentations | Contributor(s): Muhammad Alam

   Outline: Plan experiments, test carefully, and then post-mortem Summary: NBTI, HCI, TDDB, Radiation Summary: Measurement and Data Analysis Summary: Why I work on this field Conclusion

3. ECE 695A Lecture 39-1: Radiation and Devices I

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   01 May 2013 | Online Presentations | Contributor(s): Muhammad Alam

   Outline: Introduction to ZRAM Soft Errors in Zero-capacitor RAM Soft Errors in in Flash memories Hard Errors and Anomalous leakage in Flash memory Conclusions

4. ECE 695A Lecture 39-1R: Review Questions

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   Review Questions: What is the difference between hard and soft error? What is typical charge loss mechanism for ZRAM ? The soft error in Flash memory is different from that of ZRAM. Explain. How do people accelerate radiation induced damage? If carrier relaxation was faster than thermionic …

5. ECE 695A Lecture 36: Radiation Induced Damage – an overview

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1. French & American Young Engineering Scientists Symposium 2009

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   Introduction Scientists and engineers from the US and France have been building collaborative linkages between young scientists over the last two years through a series of workshops and symposia sponsored by the U.S. National Science Foundation, and the Office for Science and Technology of the …

2. NCN Nano-Devices for Medicine and Biology

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   This NCN theme seeks to extend the understanding and computational tools developed in the Nanoelectronics and NEMS themes and apply them to the development of devices for medicine and biology. The long-term vision is to develop a full hierarchy of coupled models and simulations that constitute a …

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