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This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
The Keithley Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
- Model 4200-SCS Semiconductor Characterization System product webpage
- Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit product webpage
Researchers should cite this work as follows:
Lee Stauffer (2011), "Device Characterization with the Keithley 4200-SCS," https://nanohub.org/resources/10386.
Birck Nanotechnology Center, Purdue University, West Lafayette, IN