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Device Characterization with the Keithley 4200-SCS

By Lee Stauffer

Keithley Instruments, Inc., Cleveland, OH

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Abstract

This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

Keithley Model 4200-SCS Semiconductor Characterization System

The Keithley Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.

Bio

Lee Stauffer Lee Stauffer has been with Keithley Instruments for 22 years. In that time, he has filled roles in applications engineering, technology development and business development. His current role is Senior Staff Technologist for the Semiconductor Measurements Group. His undergrad work was in electrical engineering with graduate work in physics. Prior to joining Keithley, Lee started his career working with satellite communication systems, and then several years in semiconductor fabs, working in both equipment and product engineering. Currently, Lee is working on the new class of ultra-fast I-V measurements.

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Cite this work

Researchers should cite this work as follows:

  • Lee Stauffer (2011), "Device Characterization with the Keithley 4200-SCS," http://nanohub.org/resources/10386.

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Location

Birck Nanotechnology Center, Purdue University, West Lafayette, IN

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Lecture Number/Topic Online Lecture Video Lecture Notes Supplemental Material Suggested Exercises
Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement View Flash View Notes YouTube
Introduction to Device Characterization - System Overview: System Architecture, Hardware Features and Software Features - Precision DC I-V Source-Measure Features and Concepts.

Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE) View Flash View Notes YouTube
Keithley 4200-SCS Lecture 03: More KITE Setup and Features View Flash View Notes
Keithley 4200-SCS Lecture 04: Speed and Timing Considerations View Flash View Notes YouTube
Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements View Flash View Notes YouTube
Keithley 4200-SCS Lecture 06: Troubleshooting View Flash View Notes YouTube
Keithley 4200-SCS: KITE Demo View YouTube
Keithley 4200-SCS Lecture 07: KCON Utility Overview View Flash View Notes YouTube
Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview View Flash View Notes YouTube
Theory of Operation and Measurement Overview

Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I View Flash View Notes YouTube
Measurement Techniques and Optimization

Keithley 4200-SCS Lecture 10: 4210 CVU Instrument Module - Measurement Techniques II View Flash View Notes YouTube
Measurement Techniques and Optimization

Keithley 4200-SCS Lecture 11: 4210 CVU Instrument Module - Troubleshooting View Flash View Notes YouTube
Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization View Flash View Notes YouTube

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