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Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

By Lee Stauffer

Keithley Instruments, Inc., Cleveland, OH

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Abstract

Theory of Operation and Measurement Overview

Cite this work

Researchers should cite this work as follows:

  • Lee Stauffer (2011), "Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview," https://nanohub.org/resources/10431.

Time

Location

Birck Nanotechnology Center, Purdue University, West Lafayette, IN

Tags

  1. CV curves
  2. Device Characterization
  3. devices
  4. experiments
  5. I-V curves
  6. Keithley 4200-SCS
  7. nanoelectronics

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