Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I

By Lee Stauffer

Keithley Instruments, Inc., Cleveland, OH

Published on

Abstract

Measurement Techniques and Optimization (Part 1)

Cite this work

Researchers should cite this work as follows:

  • Lee Stauffer (2011), "Keithley 4200-SCS Lecture 09: 4210 CVU Instrument Module - Measurement Techniques I," http://nanohub.org/resources/10432.

    BibTex | EndNote

Time

Location

Birck Nanotechnology Center, Purdue University, West Lafayette, IN

Tags

  1. CV curves
  2. Device Characterization
  3. devices
  4. experiments
  5. I-V curves
  6. Keithley 4200-SCS
  7. nanoelectronics