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Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

By Lee Stauffer

Keithley Instruments, Inc., Cleveland, OH

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Researchers should cite this work as follows:

  • Lee Stauffer (2011), "Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization," https://nanohub.org/resources/10521.

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Birck Nanotechnology Center, Purdue University, West Lafayette, IN

Tags

  1. CV curves
  2. Device Characterization
  3. devices
  4. experiments
  5. I-V curves
  6. Keithley 4200-SCS
  7. nanoelectronics

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