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Electronic Characterization of Materials Using Conductive AFM

By Amir Moshar

Asylum Research

View Presentation (SWF)

Category

Online Presentations

Published on

Sponsored by

Purdue University Discovery Park,
Asylum Research

Cite this work

Researchers should cite this work as follows:

  • Amir Moshar (2011), "Electronic Characterization of Materials Using Conductive AFM," https://nanohub.org/resources/11020.

Time

Location

Digital Learning Center, Purdue University, West Lafayette, IN

Tags

  1. atomic force microscopy
  2. characterization
  3. Electrical Characterization
  4. material properties
  5. material science

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