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Home › Resources › Online Presentations › Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011) › Supporting Docs
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Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

By Souvik Mahapatra

Electrical Engineering, IIT Bombay, Mumbai, India

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