Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
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Abstract
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on
hydrogen-terminated @100# silicon substrates.
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Coauthors: V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
Cite this work
Researchers should cite this work as follows:
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Brian Demczyk (2011), "Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films," https://nanohub.org/resources/12237.