Friday morning October 31, nanoHUB tools and home directories will be unavailable from 6 AM to noon (eastern time); we're getting a new file server! All tool sessions will be lost. Also, the web site will be unavailable for about 15 minutes sometime between 8-9 AM.


Support Options

Submit a Support Ticket


Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

By Brian Demczyk1, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

1. None



Published on


We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on
hydrogen-terminated @100# silicon substrates.

Cite this work

Researchers should cite this work as follows:

  • Brian Demczyk; V.M. Naik; A. Lukaszew; R. Naik; G. W. Auner (2011), "Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films,"

    BibTex | EndNote

Tags, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.