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Origin of the orientation ratio in sputtered longitudinal media

By Brian Demczyk

SynMat

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Abstract

The surface morphology, thin film microstructure, and crystallography of sputtered longitudinal
media were examined by atomic force and transmission electron microscopy.

Bio Coauthors: J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen
Cite this work

Researchers should cite this work as follows:

  • Brian Demczyk (2011), "Origin of the orientation ratio in sputtered longitudinal media," http://nanohub.org/resources/12239.

Tags
  1. magnetic thin films 1
  2. material science 1
  3. nanoelectronics 1
  4. sputtering 1
  5. thin films 1

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