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Origin of the orientation ratio in sputtered longitudinal media

By Brian Demczyk1, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen

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Abstract

The surface morphology, thin film microstructure, and crystallography of sputtered longitudinal
media were examined by atomic force and transmission electron microscopy.

Cite this work

Researchers should cite this work as follows:

  • Brian Demczyk; J. N. Zhou; G. Choe; E. Stach; E. C. Nelson; U. Dahmen (2011), "Origin of the orientation ratio in sputtered longitudinal media," http://nanohub.org/resources/12239.

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