This tool version is unpublished and cannot be run. If you would like to have this version staged, you can put a request through HUB Support.
PVpanel Sim is a spice simulation utility for two dimensional simulation of thin film solar panels, using the conventional equivalent circuit for individual cells. The tool incorporates the variability of shunt conduction from cell to cell, and effect of sheet resistance of contact material. This allows the user to assess the gap between cell and module efficiency in thin film technologies. The user can change the distribution of shunts from cell to cell, and vary the contact sheet resistance to understand their effect on panel efficiency. Another feature of the tool allows the user to analyze the effect of partial shadowing the panel due to nearby object in full 2D. The tool calculates the reverse stresses generated on the shaded cells, based on the user defined breakdown characteristics. The second version of this tool adds the capability by adding an enhanced non-linear equivalent circuit more suitable for thin film solar cells.
Mario R. Pinon, Elliott E. Gurrola, Birkir Snær Sigfússon, Sourabh Dongaonkar, Xingshu Sun, and Muhammad A. Alam
SRC-ERI Network for Photovoltaic Technology
Universality of non-Ohmic shunt leakage in thin-film solar cells,” Journal of Applied Physics
S. Dongaonkar, J. D. Servaites, G. M. Ford, S. Loser, J. Moore, R. M. Gelfand, H. Mohseni, H. W. Hillhouse, R. Agrawal, M. A. Ratner, T. J. Marks, M. S. Lundstrom, and M. A. Alam
vol. 108, no. 12, p. 124509, 2010
Identification, Characterization and Implications of Shadow Degradation in Thin Film Solar Cells
S. Dongaonkar, Y. Karthik, D. Wang, M. Frei, S. Mahapatra, and M. A. Alam
Reliability Physics Symposium (IRPS), 2011 IEEE International, 2011, pp. 5E.4.1 – 5E.4.5.
Physics and Statistics of Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon p-i-n Solar Cells
S. Dongaonkar, Karthik Y., S. Mahapatra, and M. A. Alam
IEEE Journal of Photovoltaics, 1(2), 111-117, (2011)
End to End Modeling for Variability and Reliability Analysis of Thin Film PV
S. Dongaonkar, and M. A. Alam
2012 IEEE International Reliability Physics Symposium (IRPS 2012), pp. 4A.4.1-4A.4.6
Universal statistics of parasitic shunt formation in solar cells, and its implications for cell to module efficiency gap
S. Dongaonkar, S. Loser, E. J. Sheets, K. Zaunbrecher, R. Agrawal, T. J. Marks, and M. A. Alam
Energy & Environmental Science, vol. 6, pp. 782–787, 2013
Cite this work
Researchers should cite this work as follows: